Search results for: K. Okamoto
2016 IEEE International Electron Devices Meeting (IEDM) > 16.4.1 - 16.4.4
NATO Science Series II: Mathematics, Physics and Chemistry > Scanning Probe Microscopy: Characterization, Nanofabrication and Device Application of Functional Materials > Application of Scanning Techniques to Functional Materials > 289-308
Lecture Notes in Physics > Fifteenth International Conference on Numerical Methods in Fluid Dynamics > 340-345
2015 IEEE International Electron Devices Meeting (IEDM) > 2.5.1 - 2.5.4