Search results for: Seiichi Aritome
Proceedings of the IEEE > 2017 > 105 > 9 > 1634 - 1649
2017 IEEE International Reliability Physics Symposium (IRPS) > PM-6.1 - PM-6.4
2017 IEEE International Reliability Physics Symposium (IRPS) > PM-13.1 - PM-13.4
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1516 - 1523
Solid State Electronics > 2013 > 82 > Complete > 54-62
IEEE Solid-State Circuits Magazine > 2013 > 5 > 4 > 21 - 29
IEEE Transactions on Electron Devices > 2013 > 60 > 4 > 1327 - 1333
Solid State Electronics > 2013 > 79 > Complete > 166-171
IEEE Transactions on Electron Devices > 2012 > 59 > 11 > 2950 - 2955
2011 International Electron Devices Meeting > 9.1.1 - 9.1.4
2011 International Reliability Physics Symposium > 6B.2.1 - 6B.2.4
2010 International Electron Devices Meeting > 29.7.1 - 29.7.4