Search results for: Gilson I. Wirth
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 507 - 513
IEEE Transactions on Electron Devices > 2011 > 58 > 8 > 2743 - 2751
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 507 - 513
IEEE Transactions on Electron Devices > 2011 > 58 > 8 > 2743 - 2751