Search results for: Eric Beyne
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2011 > 1 > 12 > 1885 - 1894
Journal of Materials Science > 2011 > 46 > 11 > 3868-3882
Microelectronics Reliability > 2007 > 47 > 2-3 > 259-265
Nuclear Inst. and Methods in Physics Research, A > 2003 > 509 > 1-3 > 191-199
Microelectronics Reliability > 2003 > 43 > 6 > 913-923
Microelectronics Reliability > 2003 > 43 > 3 > 351-357
Microelectronics Reliability > 2003 > 43 > 2 > 307-318
00033rd European Microwave Conference, 02003 > 2003 > 301 - 304
Microelectronics Journal > 2001 > 32 > 10-11 > 839-846
00029th European Microwave Conference, 01999 > 1999 > 3 > 150 - 153