Search results for: Paul S. Ho
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 439
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 465 - 469
Computational Materials Science > 2016 > 120 > C > 29-35
Advanced Nanoscale ULSI Interconnects: Fundamentals and Applications > Interconnect Materials > 153-167
2014 IEEE International Reliability Physics Symposium > 5A.5.1 - 5A.5.5
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 698 - 703
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 318 - 326
Journal of Mechanical Science and Technology > 2014 > 28 > 1 > 255-261
Microelectronics Reliability > 2013 > 53 > 1 > 53-62