Search results for: M. Ottavi
Electronics Letters > 2017 > 53 > 22 > 1462 - 1464
Microelectronics Reliability > 2014 > 54 > 1 > 338-340
Electronics Letters > 2012 > 48 > 23 > 1470 - 1472
IEEE Transactions on Computers > 2008 > 57 > 5 > 606 - 618
IEEE Transactions on Instrumentation and Measurement > 2006 > 55 > 5 > 1704 - 1712
Journal of Electronic Testing > 2005 > 21 > 4 > 429-444