Search results for: P. Reviriego
Microelectronics Reliability > 2017 > 72 > C > 85-89
Microelectronics Reliability > 2016 > 63 > C > 314-318
IEEE Transactions on Parallel and Distributed Systems > 2016 > 27 > 1 > 303 - 304
Electronics Letters > 2015 > 51 > 1 > 50 - 52
Computer Communications > 2014 > 50 > Complete > 110-118
Electronics Letters > 2014 > 50 > 22 > 1602 - 1604
IEEE Communications Letters > 2014 > 18 > 5 > 885 - 888
IEEE Communications Letters > 2014 > 18 > 10 > 1695 - 1698
Microelectronics Reliability > 2014 > 54 > 1 > 335-337
Microelectronics Reliability > 2014 > 54 > 1 > 338-340
Electronics Letters > 2013 > 49 > 25 > 1617 - 1618
Microelectronics Reliability > 2012 > 52 > 7 > 1528-1530
Electronics Letters > 2012 > 48 > 23 > 1470 - 1472
IEEE Transactions on Nuclear Science > 2012 > 59 > 3-2 > 619 - 624
Optical Switching and Networking > 2011 > 8 > 3 > 131-138