Search results for: Ronald D Schrimpf
IEEE Transactions on Nuclear Science > 2017 > 64 > 5 > 1133 - 1136
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 263 - 268
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 226 - 232
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 541 - 548
IEEE Transactions on Electron Devices > 2016 > 63 > 8 > 3069 - 3075
IEEE Transactions on Nuclear Science > 2015 > 62 > 6-1 > 2867 - 2873
IEEE Transactions on Nuclear Science > 2015 > 62 > 5-2 > 2181 - 2186
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 352 - 358
IEEE Transactions on Nuclear Science > 2015 > 62 > 4-1 > 1558 - 1567
IEEE Transactions on Nuclear Science > 2013 > 60 > 6-1 > 4150 - 4158
IEEE Transactions on Device and Materials Reliability > 2012 > 12 > 2 > 391 - 398
IEEE Transactions on Nuclear Science > 2011 > 58 > 2 > 499 - 505
IEEE Transactions on Nuclear Science > 2010 > 57 > 4-2 > 2318 - 2326