Search results for: A Arreghini
2017 IEEE International Reliability Physics Symposium (IRPS) > 5A-2.1 - 5A-2.6
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 130 - 136
2016 IEEE International Reliability Physics Symposium (IRPS) > 6C-4-1 - 6C-4-5
2015 IEEE International Electron Devices Meeting (IEDM) > 5.6.1 - 5.6.4
2015 IEEE International Electron Devices Meeting (IEDM) > 3.1.1 - 3.1.4
Microelectronic Engineering > 2015 > 147 > C > 45-50
2013 IEEE International Electron Devices Meeting > 21.3.1 - 21.3.4
2013 IEEE International Electron Devices Meeting > 21.2.1 - 21.2.4
2012 International Electron Devices Meeting > 9.2.1 - 9.2.4
Solid State Electronics > 2012 > 74 > Complete > 64-70
2011 International Electron Devices Meeting > 12.4.1 - 12.4.4
Solid State Electronics > 2011 > 65-66 > Complete > 177-183
Microelectronic Engineering > 2011 > 88 > 7 > 1164-1167
Microelectronic Engineering > 2011 > 88 > 7 > 1155-1158