Search results for: G Van den bosch
2017 IEEE International Reliability Physics Symposium (IRPS) > 5A-2.1 - 5A-2.6
IEEE Transactions on Electron Devices > 2017 > 64 > 1 > 130 - 136
2016 IEEE International Reliability Physics Symposium (IRPS) > 6C-4-1 - 6C-4-5
2015 IEEE International Electron Devices Meeting (IEDM) > 5.6.1 - 5.6.4
2015 IEEE International Electron Devices Meeting (IEDM) > 3.1.1 - 3.1.4
Microelectronic Engineering > 2015 > 147 > C > 45-50
Microelectronics Reliability > 2014 > 54 > 9-10 > 2258-2261
2014 IEEE International Reliability Physics Symposium > MY.1.1 - MY.1.5
2014 IEEE International Reliability Physics Symposium > 2E.3.1 - 2E.3.6
2013 IEEE International Electron Devices Meeting > 21.3.1 - 21.3.4
2013 IEEE International Electron Devices Meeting > 21.2.1 - 21.2.4
Microelectronic Engineering > 2013 > 109 > Complete > 39-42
2013 IEEE International Reliability Physics Symposium (IRPS) > MY.6.1 - MY.6.4
2012 International Electron Devices Meeting > 2.2.1 - 2.2.4