Search results for: Wang Jiang Chau
Journal of Electronic Testing > 2015 > 31 > 3 > 255-273
Journal of Electronic Testing > 2013 > 29 > 2 > 223-236
2012 IEEE International SOC Conference > 248 - 253
Analog Integrated Circuits and Signal Processing > 2012 > 73 > 3 > 851-860