Search results for: C.K. Yoon
IEEE Transactions on Advanced Packaging > 2008 > 31 > 2 > 367 - 376
Microelectronics Reliability > 2005 > 45 > 9-11 > 1360-1364
Microelectronics Reliability > 2005 > 45 > 9-11 > 1317-1320
IEEE Transactions on Advanced Packaging > 2008 > 31 > 2 > 367 - 376
Microelectronics Reliability > 2005 > 45 > 9-11 > 1360-1364
Microelectronics Reliability > 2005 > 45 > 9-11 > 1317-1320