Search results for: F. Richardeau
Microelectronics Reliability > 2017 > 76-77 > C > 500-506
Microelectronics Reliability > 2017 > 76-77 > C > 532-538
Mathematics and Computers in Simulation > 2017 > 131 > C > 190-199
Microelectronics Reliability > 2015 > 55 > 9-10 > 1956-1960
Electronics Letters > 2009 > 45 > 23 > 1191 - 1193
IEEE Transactions on Power Electronics > 2008 > 23 > 2 > 802 - 812
2005 European Conference on Power Electronics and Applications > 12 pp. - P.12