Search results for: O. Cueto
2015 IEEE International Electron Devices Meeting (IEDM) > 17.2.1 - 17.2.4
2014 IEEE International Electron Devices Meeting > 9.2.1 - 9.2.4
2014 IEEE International Electron Devices Meeting > 6.5.1 - 6.5.4
Microelectronic Engineering > 2014 > 118 > Complete > 15-19
2013 IEEE International Electron Devices Meeting > 26.4.1 - 26.4.4
2013 IEEE International Electron Devices Meeting > 30.2.1 - 30.2.4
Microelectronics Reliability > 2012 > 52 > 9-10 > 1928-1931
2011 International Electron Devices Meeting > 9.5.1 - 9.5.4
Microelectronic Engineering > 2011 > 88 > 5 > 827-832