Search results for: C. Guedj
Journal of Electron Spectroscopy and Related Phenomena > 2016 > 213 > C > 1-10
Solid-State Electronics > 2016 > 125 > C > 182-188
Microelectronic Engineering > 2016 > 156 > C > 78-81
2014 IEEE International Electron Devices Meeting > 16.2.1 - 16.2.4
Microelectronic Engineering > 2011 > 88 > 7 > 1140-1142
Solid State Electronics > 2011 > 58 > 1 > 62-67
Surface and Interface Analysis > 42 > 6‐7 > 783 - 786
2007 IEEE International Electron Devices Meeting > 977 - 980
Microelectronics Reliability > 2007 > 47 > 4-5 > 764-768
IEEE Transactions on Device and Materials Reliability > 2007 > 7 > 1 > 64 - 68
Microelectronic Engineering > 2006 > 83 > 11-12 > 2386-2390