Search results for: Hyungcheol Shin
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 758 - 762
IEEE Electron Device Letters > 2014 > 35 > 3 > 348 - 350
IEEE Electron Device Letters > 2013 > 34 > 9 > 1139 - 1141
IEEE Transactions on Electron Devices > 2013 > 60 > 3 > 1268 - 1271
IEEE Transactions on Electron Devices > 2013 > 60 > 3 > 1099 - 1107
IEEE Electron Device Letters > 2013 > 34 > 1 > 48 - 50
IEEE Transactions on Electron Devices > 2012 > 59 > 12 > 3495 - 3502
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1741 - 1747
IEEE Electron Device Letters > 2011 > 32 > 4 > 569 - 571
IEEE Transactions on Nanotechnology > 2011 > 10 > 6 > 1352 - 1356
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1643 - 1648
IEEE Transactions on Electron Devices > 2011 > 58 > 8 > 2752 - 2758
IEEE Transactions on Nanotechnology > 2010 > 9 > 1 > 70 - 77
IEEE Transactions on Electron Devices > 2010 > 57 > 4 > 913 - 918
IEEE Electron Device Letters > 2010 > 31 > 9 > 1029 - 1031