Search results for: J.S. Suehle
2012 IEEE International Reliability Physics Symposium (IRPS) > XT.1.1 - XT.1.4
Thin Solid Films > 2011 > 519 > 9 > 2811-2816
Microelectronic Engineering > 2009 > 86 > 7-9 > 1957-1960
Microelectronic Engineering > 2008 > 85 > 12 > 2403-2405
2008 8th IEEE Conference on Nanotechnology > 526 - 529
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 4 > 635 - 641
IEEE Transactions on Electron Devices > 2008 > 55 > 8 > 2061 - 2070