Search results for: Zs. Tokei
2017 IEEE International Reliability Physics Symposium (IRPS) > 6B-2.1 - 6B-2.8
Springer Proceedings in Physics > Microscopy of Semiconducting Materials > Processed Silicon and Other Device Materials > 347-350
Engineering Materials and Processes > Materials for Information Technology > Recent Advances in Thin-film Deposition > 61-68
2016 IEEE International Reliability Physics Symposium (IRPS) > 3A-2-1 - 3A-2-6
2015 IEEE International Reliability Physics Symposium > 2D.6.1 - 2D.6.5
2015 IEEE International Reliability Physics Symposium > BD.5.1 - BD.5.5
2015 IEEE International Reliability Physics Symposium > 2A.3.1 - 2A.3.5
Microelectronics Reliability > 2014 > 54 > 9-10 > 1675-1679
2014 IEEE International Reliability Physics Symposium > 3A.2.1 - 3A.2.6