Search results for: G. Torrens
Microelectronics Reliability > 2017 > 78 > C > 38-45
Tetrahedron Letters > 2016 > 57 > 26 > 2842-2844
IEEE Transactions on Nuclear Science > 2014 > 61 > 4-1 > 1849 - 1855
IEEE Transactions on Circuits and Systems II: Express Briefs > 2010 > 57 > 4 > 280 - 284