Search results for: Masahiro Aoyagi
Microelectronics Reliability > 2017 > 79 > C > 380-386
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2017 > 7 > 9 > 1506 - 1515
Microelectronics Reliability > 2016 > 67 > C > 2-8
Physica C: Superconductivity > 2016 > 530 > C > 90-92
2016 IEEE SENSORS > 1 - 3
Microelectronics Reliability > 2016 > 63 > C > 142-147
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2016 > 6 > 4 > 510 - 517
Microelectronics Reliability > 2016 > 59 > C > 95-101
Microelectronics Journal > 2015 > 46 > 12 Part A > 1106-1113