Search results for: R. Wacquez
2016 IEEE International Reliability Physics Symposium (IRPS) > 7B-4-1 - 7B-4-7
Engineering Materials > Semiconductor-On-Insulator Materials for Nanoelectronics Applications > Physics of Modern SemOI Devices > 251-263
2013 IEEE International Electron Devices Meeting > 26.4.1 - 26.4.4
2013 IEEE International Electron Devices Meeting > 9.2.1 - 9.2.4
Solid State Electronics > 2013 > 84 > Complete > 179-184
2012 International Electron Devices Meeting > 8.7.1 - 8.7.4
2012 International Electron Devices Meeting > 18.1.1 - 18.1.4
2012 International Electron Devices Meeting > 3.6.1 - 3.6.4