Search results for: B. De Salvo
2017 IEEE International Reliability Physics Symposium (IRPS) > PM-2.1 - PM-2.5
IEEE Transactions on Nuclear Science > 2017 > 64 > 8-1 > 2038 - 2045
2016 IEEE International Electron Devices Meeting (IEDM) > 4.5.1 - 4.5.4
2015 IEEE International Electron Devices Meeting (IEDM) > 17.2.1 - 17.2.4
2014 IEEE International Electron Devices Meeting > 9.2.1 - 9.2.4
2014 IEEE International Electron Devices Meeting > 6.5.1 - 6.5.4
2014 IEEE International Electron Devices Meeting > 6.1.1 - 6.1.4
Thin Solid Films > 2014 > 563 > Complete > 15-19
2014 IEEE International Reliability Physics Symposium > 5E.3.1 - 5E.3.4