Search results for: Michael Nelhiebel
physica status solidi (RRL) – Rapid Research Letters > 16 > 10 > n/a - n/a
IEEE Transactions on Power Electronics > 2017 > 32 > 1 > 561 - 570
Proceedings of the Winter Simulation Conference 2014 > 2609 - 2616
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 169 - 176
Microelectronics Reliability > 2013 > 53 > 7 > 937-946
IEEE Electron Device Letters > 2013 > 34 > 8 > 939 - 941
Microelectronics Reliability > 2012 > 52 > 9-10 > 2374-2379
2012 IEEE International Reliability Physics Symposium (IRPS) > XT.2.1 - XT.2.6
2011 International Electron Devices Meeting > 27.3.1 - 27.3.4