Search results for: Patrick M. Lenahan
IEEE Transactions on Nuclear Science > 2017 > 64 > 1-1 > 197 - 203
Microelectronics Reliability > 2016 > 63 > C > 201-213
IEEE Transactions on Electron Devices > 2015 > 62 > 2 > 301 - 308
2012 IEEE International Reliability Physics Symposium (IRPS) > XT.2.1 - XT.2.6
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 3 > 490
IEEE Transactions on Nuclear Science > 1987 > 34 > 6-I > 1147 - 1151