Search results for: Stefano de Filippis
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 169 - 176
Microelectronics Reliability > 2012 > 52 > 9-10 > 2374-2379
Microelectronics Reliability > 2011 > 51 > 9-11 > 1913-1918
Microelectronics Reliability > 2011 > 51 > 9-11 > 1954-1958