Search results for: Thomas Aichinger
Microelectronics Reliability > 2018 > 80 > C > 68-78
2016 IEEE International Electron Devices Meeting (IEDM) > 10.8.1 - 10.8.4
IEEE Transactions on Electron Devices > 2015 > 62 > 1 > 155 - 163
physica status solidi c > 11 > 11‐12 > 1593 - 1596
Microelectronics Reliability > 2013 > 53 > 7 > 937-946
2012 IEEE International Reliability Physics Symposium (IRPS) > XT.2.1 - XT.2.6
2011 International Electron Devices Meeting > 27.3.1 - 27.3.4
Microelectronics Reliability > 2011 > 51 > 9-11 > 1530-1534
IEEE Transactions on Electron Devices > 2011 > 58 > 11 > 3652 - 3666
IEEE Transactions on Components, Packaging and Manufacturing Technology > 2011 > 1 > 11 > 1677 - 1684
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 3 > 509 - 518
Industrial Crops & Products > 2001 > 14 > 3 > 229 - 239