Search results for: B. Grimbert
Solid State Electronics > 2015 > 113 > Complete > 49-53
Electronics Letters > 2015 > 51 > 19 > 1532 - 1534
2013 IEEE International Reliability Physics Symposium (IRPS) > 3C.3.1 - 3C.3.6
IEEE Electron Device Letters > 2012 > 33 > 8 > 1168 - 1170
IEEE Electron Device Letters > 2012 > 33 > 9 > 1258 - 1260
Microelectronic Engineering > 2011 > 88 > 4 > 370-372
IEEE Electron Device Letters > 2011 > 32 > 9 > 1230 - 1232
2008 IEEE MTT-S International Microwave Symposium Digest > 1131 - 1134
Journal of Crystal Growth > 2007 > 298 > Complete > 826-830