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The microstructure and mechanical behavior of Sn-Ag-Cu (SAC) soldering alloys can change significantly over time when exposed to isothermal aging and in-situ current stress. Electronics assemblies built with SAC solder joints are exposed to elevated ambient temperatures and relatively high current densities for prolonged periods of time. Therefore it is important to understand the impact of these...
High end networking and computing applications continue to drive silicon technologies for higher data rates and increased bandwidth. The push for silicon performance with 45nm and 32nm devices also drives a need for packaging performance to deliver clean and efficient power to the device. This paper compares the electrical performance, assembly and reliability of various advanced packaging technologies,...
Chip-scale package (CSP) is commonly seen on high density boards as it minimizes the foot print while packed more functionality into one component. Board level reliability concern over CSPs is that finer pitch limits the solder ball size attached and the stencil thickness used in assembly which leads to much smaller joint volume and standoff while larger die-to-package ratio typically means higher...
In an ever-increasingly connected world, the boundaries or obstacles to accessing information are being torn down by business necessity, personal preferences and technical innovations. The Borderless Network is creating the ability for customers to work anywhere, with any device using services and applications like video, collaboration, with a secure, reliable and seamless communication experience...
The conversion to Pb-free solders has already been implemented in the consumer market. However, the transition to Pb-free solders in the high performance, mission critical networking/server industry has not yet been fully implemented. A significant factor in the slow transition to Pb-free solders is the absence of industry accepted Pb-free acceleration transforms that can translate lab test results...
Power and power density increase in microelectronics is a major challenge for packaging high performance ASIC and microprocessor devices. The thermal interface material (TIM) used between the chip and the heat spreader of the Flip Chip Plastic Ball Grid Array (FC-PBGA) package plays a very important role in the package thermal performance. Not only does it affect package thermal performance, it can...
Reliability of the flip-chip plastic ball grid array (FC-PBGA) packages is highly dependent on the properties of the constituent components and the interface formed between them. The relative mechanical compliances and thermal mismatch between the silicon chip, the underfill material and the organic laminate substrate are particularly important to the design and performance the package. Strong coupling...
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