Search results for: G F Jiao
2014 IEEE International Reliability Physics Symposium > 6B.1.1 - 6B.1.4
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 4 > 972 - 977
2011 International Electron Devices Meeting > 27.1.1 - 27.1.4
IEEE Transactions on Electron Devices > 2011 > 58 > 7 > 2122 - 2126
IEEE Electron Device Letters > 2010 > 31 > 8 > 779 - 781
IEEE Electron Device Letters > 2010 > 31 > 5 > 396 - 398