Search results for: E San Andres
IEEE Electron Device Letters > 2017 > 38 > 5 > 611 - 614
Measurement > 2017 > 98 > C > 151-158
Thin Solid Films > 2015 > 593 > Complete > 62-66
2013 Spanish Conference on Electron Devices > 285 - 288
Thin Solid Films > 2012 > 526 > Complete > 81-86
Microelectronic Engineering > 2011 > 88 > 9 > 2991-2996
Microelectronics Reliability > 2011 > 51 > 9-11 > 1521-1524
Microelectronic Engineering > 2011 > 88 > 7 > 1357-1360
Thin Solid Films > 2011 > 519 > 7 > 2268-2272
IEEE Transactions on Electron Devices > 2008 > 55 > 12 > 3432 - 3441
Microelectronic Engineering > 2007 > 84 > 9-10 > 2058-2062