Search results for: A. Shickova
IEEE Transactions on Electron Devices > 2008 > 55 > 12 > 3432 - 3441
Microelectronic Engineering > 2007 > 84 > 9-10 > 1906-1909
Microelectronics Reliability > 2007 > 47 > 4-5 > 505-507
IEEE Electron Device Letters > 2007 > 28 > 11 > 987 - 989
IEEE Electron Device Letters > 2007 > 28 > 3 > 242 - 244