Search results for: Al Burk
Journal of Electronic Materials > 2014 > 43 > 4 > 809-813
2010 IEEE MTT-S International Microwave Symposium > 1226 - 1229
Microelectronics Reliability > 2009 > 49 > 1 > 32-37
Solid State Electronics > 2008 > 52 > 7 > 1008-1010
Journal of Electronic Materials > 2008 > 37 > 5 > 662-665
Political Geography > 2003 > 22 > 3 > 317-333