Search results for: R.-P. Vollertsen
Microelectronics Reliability > 2016 > 64 > C > 2-12
2015 IEEE International Reliability Physics Symposium > CA.3.1 - CA.3.6
IEEE Transactions on Device and Materials Reliability > 2009 > 9 > 2 > 106 - 114
Microelectronics Reliability > 2004 > 44 > 6 > 909-916
Microelectronics Reliability > 2003 > 43 > 6 > 865-878
Microelectronics Reliability > 1996 > 36 > 11-12 > 1631-1638
Microelectronics Reliability > 1996 > 36 > 7-8 > 1019-1031