Search results for: H. Reisinger
e & i Elektrotechnik und Informationstechnik > 2018 > 135 > 8 > 563-566
2017 IEEE International Reliability Physics Symposium (IRPS) > XT-10.1 - XT-10.6
2017 IEEE International Reliability Physics Symposium (IRPS) > 6A-2.1 - 6A-2.6
2016 IEEE International Reliability Physics Symposium (IRPS) > 5A-2-1 - 5A-2-8
2016 IEEE International Reliability Physics Symposium (IRPS) > 4C-4-1 - 4C-4-6
2015 IEEE International Electron Devices Meeting (IEDM) > 20.1.1 - 20.1.4
Microelectronic Engineering > 2015 > 147 > C > 126-129
2014 IEEE International Electron Devices Meeting > 21.1.1 - 21.1.4
2014 IEEE International Reliability Physics Symposium > 4A.5.1 - 4A.5.7
2014 IEEE International Reliability Physics Symposium > XT.13.1 - XT.13.6
2013 IEEE International Electron Devices Meeting > 15.5.1 - 15.5.4
2013 IEEE International Reliability Physics Symposium (IRPS) > 2D.2.1 - 2D.2.7
2012 International Electron Devices Meeting > 19.6.1 - 19.6.4