Search results for: V. Banu
Microelectronics Reliability > 2016 > 64 > C > 429-433
Microelectronics Reliability > 2014 > 54 > 9-10 > 2207-2212
International Journal of Mycobacteriology > 2012 > 1 > 4 > 185-189
CAS 2012 (International Semiconductor Conference) > 2 > 359 - 362
Microelectronics Reliability > 2012 > 52 > 9-10 > 2314-2320
Microelectronics Reliability > 2012 > 52 > 9-10 > 2250-2255
IEEE Transactions on Industrial Electronics > 2011 > 58 > 7 > 2582 - 2590
Materials Science & Engineering B > 2009 > 165 > 1-2 > 15-17