Search results for: Neng Chen
IEEE Transactions on Biomedical Circuits and Systems > 2017 > 11 > 5 > 1013 - 1025
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1666 - 1673
IEEE Transactions on Electron Devices > 2017 > 64 > 4 > 1660 - 1665
IEEE Journal of the Electron Devices Society > 2017 > 5 > 2 > 132 - 135
2016 IEEE International Electron Devices Meeting (IEDM) > 9.2.1 - 9.2.4
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 129 - 135
IEEE Transactions on Biomedical Circuits and Systems > 2014 > 8 > 6 > 810 - 823
IEEE Electron Device Letters > 2014 > 35 > 8 > 865 - 867
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 715 - 720
IEEE Electron Device Letters > 2014 > 35 > 2 > 256 - 258
IEEE Electron Device Letters > 2013 > 34 > 5 > 671 - 673
IEEE Electron Device Letters > 2013 > 34 > 1 > 102 - 104