Search results for: M. Shinosky
2013 IEEE International Reliability Physics Symposium (IRPS) > 2F.2.1 - 2F.2.7
2013 IEEE International Reliability Physics Symposium (IRPS) > PI.1.1 - PI.1.5
2011 International Reliability Physics Symposium > 2F.2.1 - 2F.2.8
IEEE Transactions on Electron Devices > 2009 > 56 > 1 > 2 - 12
Microelectronics Reliability > 2008 > 48 > 8-9 > 1375-1383