Search results for: Chun Yu
IEEE Transactions on Electron Devices > 2017 > 64 > 10 > 3979 - 3985
IEEE Electron Device Letters > 2017 > 38 > 6 > 712 - 715
IEEE Transactions on Device and Materials Reliability > 2016 > 16 > 4 > 688 - 690
IEEE Electron Device Letters > 2016 > 37 > 11 > 1387 - 1390
2016 IEEE International Reliability Physics Symposium (IRPS) > EL-1-1 - EL-1-4
IEEE Transactions on Electron Devices > 2016 > 63 > 2 > 531 - 536
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 633 - 636
IEEE Transactions on Electron Devices > 2015 > 62 > 9 > 2824 - 2829
IEEE Transactions on Electron Devices > 2015 > 62 > 4 > 1349 - 1352
IEEE Transactions on Microwave Theory and Techniques > 2014 > 62 > 11 > 2723 - 2732
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 2 > 775 - 777