Search results for: Pin-Hsin Chang
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 633 - 636
IEEE Transactions on Electron Devices > 2015 > 62 > 4 > 1349 - 1352
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 633 - 636
IEEE Transactions on Electron Devices > 2015 > 62 > 4 > 1349 - 1352