Search results for: F. Temcamani
Microelectronics Reliability > 2016 > 64 > C > 585-588
Microelectronics Reliability > 2015 > 55 > 9-10 > 1703-1707
Microelectronics Reliability > 2012 > 52 > 11 > 2561-2567
Microelectronics Reliability > 2012 > 52 > 9-10 > 2205-2209
2009 International Semiconductor Conference > 2 > 397 - 400
2006 IEEE MTT-S International Microwave Symposium Digest > 1542 - 1545