Search results for: L. Bechou
Microelectronics Reliability > 2017 > 76-77 > C > 579-583
IEEE Photonics Technology Letters > 2016 > 28 > 6 > 665 - 668
Microelectronics Reliability > 2015 > 55 > 9-10 > 1741-1745
Microelectronics Reliability > 2015 > 55 > 9-10 > 1746-1749
Microelectronics Reliability > 2013 > 53 > 9-11 > 1506-1509
Microelectronics Reliability > 2013 > 53 > 9-11 > 1514-1518
Microelectronics Reliability > 2011 > 51 > 9-11 > 1999-2003
Microelectronics Reliability > 2010 > 50 > 9-11 > 1568-1573
IEEE Transactions on Device and Materials Reliability > 2010 > 10 > 1 > 164 - 170