Search results for: Piero Olivo
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 4 > 713 - 721
2017 IEEE International Reliability Physics Symposium (IRPS) > PM-5.1 - PM-5.4
2016 IEEE International Reliability Physics Symposium (IRPS) > 2B-3-1 - 2B-3-6
IEEE Transactions on Electron Devices > 2016 > 63 > 4 > 1516 - 1523
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 4 > 529 - 535
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 3 > 363 - 369
IEEE Transactions on Device and Materials Reliability > 2014 > 14 > 1 > 66 - 73
IEEE Transactions on Electron Devices > 2014 > 61 > 11 > 3716 - 3722
IEEE Electron Device Letters > 2013 > 34 > 3 > 390 - 392
IEEE Electron Device Letters > 2013 > 34 > 4 > 514 - 516
IEEE Transactions on Electron Devices > 2012 > 59 > 3 > 813 - 818
IEEE Transactions on Electron Devices > 2011 > 58 > 11 > 3707 - 3711
IEEE Embedded Systems Letters > 2011 > 3 > 1 > 13 - 15
IEEE Electron Device Letters > 2010 > 31 > 6 > 612 - 614