Search results for: Sanghyeon Baeg
Microelectronics Reliability > 2018 > 80 > C > 85-90
2017 IEEE International Reliability Physics Symposium (IRPS) > SE-3.1 - SE-3.6
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2017 > 25 > 4 > 1583 - 1587
IEEE Transactions on Nuclear Science > 2017 > 64 > 2 > 859 - 866
Microelectronics Reliability > 2017 > 69 > C > 88-99
Microelectronics Reliability > 2017 > 69 > C > 100-108
Microelectronics Reliability > 2016 > 67 > C > 143-149
Microelectronics Reliability > 2016 > 57 > C > 39-46
IEEE Transactions on Nuclear Science > 2015 > 62 > 2 > 520 - 526
2015 IEEE International Reliability Physics Symposium > SE.3.1 - SE.3.5
IEEE Transactions on Computers > 2014 > 63 > 8 > 2094 - 2098
IEEE Transactions on Nuclear Science > 2014 > 61 > 5-2 > 2711 - 2717
Microprocessors and Microsystems > 2013 > 37 > 8 Part D > 1103-1107
IEEE Transactions on Nuclear Science > 2013 > 60 > 2-2 > 1384 - 1389
IEEE Transactions on Instrumentation and Measurement > 2012 > 61 > 12 > 3259 - 3272
IEEE Transactions on Circuits and Systems I: Regular Papers > 2012 > 59 > 12 > 2969 - 2979
Journal of the Korean Physical Society > 2012 > 61 > 5 > 749-753