Search results for: Soonyoung Lee
2017 IEEE International Reliability Physics Symposium (IRPS) > 2E-3.1 - 2E-3.4
2017 IEEE International Reliability Physics Symposium (IRPS) > SE-1.1 - SE-1.4
Microelectronics Reliability > 2017 > 69 > C > 100-108
2016 IEEE International Electron Devices Meeting (IEDM) > 15.1.1 - 15.1.4
2016 IEEE International Reliability Physics Symposium (IRPS) > 3B-4-1 - 3B-4-4
2015 IEEE International Electron Devices Meeting (IEDM) > 11.3.1 - 11.3.4
IEEE Transactions on Nuclear Science > 2015 > 62 > 4-1 > 1642 - 1649
2015 IEEE International Reliability Physics Symposium > 4B.1.1 - 4B.1.4
2015 IEEE International Reliability Physics Symposium > SE.3.1 - SE.3.5
IEEE Transactions on Computers > 2014 > 63 > 8 > 2094 - 2098
IEEE Transactions on Nuclear Science > 2014 > 61 > 5-2 > 2711 - 2717
IEEE Transactions on Nuclear Science > 2013 > 60 > 2-2 > 1384 - 1389
Journal of the Korean Physical Society > 2012 > 61 > 5 > 749-753