Search results for: Chulseung Lim
Microelectronics Reliability > 2018 > 80 > C > 85-90
2017 IEEE International Reliability Physics Symposium (IRPS) > SE-3.1 - SE-3.6
IEEE Transactions on Nuclear Science > 2017 > 64 > 2 > 859 - 866
Microelectronics Reliability > 2017 > 69 > C > 100-108
Microelectronics Reliability > 2016 > 57 > C > 39-46
IEEE Transactions on Nuclear Science > 2015 > 62 > 2 > 520 - 526