Search results for: N. Rinaldi
Microelectronics Reliability > 2015 > 55 > 9-10 > 1433-1437
Microelectronics Reliability > 2013 > 53 > 9-11 > 1471-1475
IEEE Transactions on Very Large Scale Integration (VLSI) Systems > 2012 > 20 > 1 > 162 - 166
Microelectronics Reliability > 2010 > 50 > 9-11 > 1577-1580