Search results for: Yuan Lu
2015 IEEE International Electron Devices Meeting (IEDM) > 3.2.1 - 3.2.4
IEEE Transactions on Device and Materials Reliability > 2015 > 15 > 2 > 136 - 141
IEEE Transactions on Electron Devices > 2014 > 61 > 6 > 2064 - 2070
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1620 - 1627