Search results for: Wen-Jer Tsai
2017 IEEE International Reliability Physics Symposium (IRPS) > PM-7.1 - PM-7.4
IEEE Electron Device Letters > 2017 > 38 > 1 > 48 - 51
2016 IEEE International Electron Devices Meeting (IEDM) > 11.3.1 - 11.3.4
IEEE Transactions on Electron Devices > 2011 > 58 > 4 > 945 - 952
IEEE Transactions on Electron Devices > 2011 > 58 > 6 > 1620 - 1627
IEEE Electron Device Letters > 2009 > 30 > 2 > 165 - 167
IEEE Transactions on Electron Devices > 2008 > 55 > 8 > 2202 - 2211