Search results for: François Marc
IEEE Transactions on Device and Materials Reliability > 2017 > 17 > 3 > 490 - 506
IEEE Transactions on Electron Devices > 2013 > 60 > 3 > 1068 - 1074
Journal of Electronic Testing > 2013 > 29 > 2 > 127-141
Microelectronics Reliability > 1997 > 37 > 10-11 > 1619-1622