Search results for: Yves Danto
IEEE Transactions on Device and Materials Reliability > 2008 > 8 > 3 > 441
Comptes rendus - Physique > 2008 > 9 > 1 > 95-109
Microelectronics Reliability > 2007 > 47 > 2-3 > 319-325
Microelectronics Reliability > 1997 > 37 > 10-11 > 1619-1622